Detecting filter-cake pathologies in solid-liquid filtration: Semi-tech scale demonstrations using electrical resistance tomography (ERT)

1st World Congress on Industrial Process Tomography

Volumn , Issue , 1999, Pages 120-125

  Vlaev, D ^a   Wang, M ^a   Dyakowski, T ^a   Mann, R ^a   Grieve, B D ^b  

^a UNIVERSITY OF MANCHESTER   (United Kingdom)

^b ASTRAZENECA   (United Kingdom)

Author keywords

Filtration; Process pathology; Resistance tomography

Indexed keywords

ELECTRIC RESISTANCE; LIQUIDS; PATHOLOGY; TOMOGRAPHY;

ARTIFICIAL SURFACES; DATA ACQUISATION SYSTEMS; DEGREE OF SENSITIVITY; ELECTRICAL RESISTANCE TOMOGRAPHY; FILTRATION PROCESS; FINE CHEMICALS; HIGH SENSITIVITY; LINEAR BACK PROJECTION;

FILTRATION;

EID: 0013291511     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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