Comparing on-wafer cal techniques to 110 GHz

Microwaves and RF

Volumn 39, Issue 1, 2000, Pages 114-118

  Lord, Anthony J ^a  

^a Cascade Microtech Europe Ltd   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0013276722     PISSN: 07452993     EISSN: None     Source Type: Trade Journal    
DOI: None     Document Type: Article

References (5)

1. Roger Marks, "A Mult-Line Method Of Network Analyzer Calibration," IEEE Transactions On Microwave Theory & Techniques, Vol. 39, No. 7, pp. 1205-1215, July 1991.
2. Ed Godshalk, "Surface Wave Phenomenon In Wafer Probing Environments," 40th ARFTG Conference Digest, December 1992.
3. "Technique Verifies LRRM Calibrations For GaAs Measurements," Application Note, Cascade Microtech, Inc., Hillsdale, OR.
4. John Pence, "Verification Of LRRM Calibrations With Load Inductance Compensation For CPW Measurements On GaAs Substrates," 42nd ARFTG Conference Digest, November 1903.
5. WinCal 2.30 Calibration and Measurements Tool, Commercial Product, Cascade Microtech, Inc., Hillsdale, OR.