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Volumn 71, Issue 4, 2000, Pages 1595-1601

Real-time optical measurements with picosecond resolution during laser induced transformations

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0013227823     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1150503     Document Type: Article
Times cited : (23)

References (41)
  • 2
    • 0003343159 scopus 로고    scopus 로고
    • Ultrafast Spectroscopy of Semiconductors and Semiconductor Nanostructures
    • Springer, Berlin
    • J. Shah, Ultrafast Spectroscopy of Semiconductors and Semiconductor Nanostructures, Springer Series in Solid State Sciences Vol. 115 (Springer, Berlin, 1996).
    • (1996) Springer Series in Solid State Sciences , vol.115
    • Shah, J.1
  • 3
    • 0001102902 scopus 로고
    • Ultrashort Laser Pulses and Applications
    • Springer, Berlin
    • See, for instance, Ultrashort Laser Pulses and Applications, edited by W. Kaiser, Topics in Applied Physics, Vol. 60 (Springer, Berlin, 1988) or any of the volumes of the series Ultrafast Phenomena like Ultrafast Phenomena Xl, Springer Series on Chemical Physics Vol. 63 (Springer, Berlin, 1998).
    • (1988) Topics in Applied Physics , vol.60
    • Kaiser, W.1
  • 4
    • 0346649542 scopus 로고    scopus 로고
    • Ultrafast Phenomena like Ultrafast Phenomena Xl
    • Springer, Berlin
    • See, for instance, Ultrashort Laser Pulses and Applications, edited by W. Kaiser, Topics in Applied Physics, Vol. 60 (Springer, Berlin, 1988) or any of the volumes of the series Ultrafast Phenomena like Ultrafast Phenomena Xl, Springer Series on Chemical Physics Vol. 63 (Springer, Berlin, 1998).
    • (1998) Springer Series on Chemical Physics , vol.63
  • 25
    • 85037492787 scopus 로고    scopus 로고
    • Ph.D. thesis, Facultad de Ciencias Físicas de la Universidad Autónoma de Madrid/Instituto de Optica, CSIC, Spain
    • J. Siegel, Ph.D. thesis, Facultad de Ciencias Físicas de la Universidad Autónoma de Madrid/Instituto de Optica, CSIC, Spain, 1999.
    • (1999)
    • Siegel, J.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.