Quantification of H, B and F in kornerupine: Accuracy of SIMS and SREF (X-ray single-crystal structure-refinement) data

Microchimica Acta

Volumn 139, Issue 1-4, 2002, Pages 125-129

  Ottolini, Luisa ^a   Cámara, Fernando ^a   Hawthorne, Frank C ^b  

^a CNR   (Italy)

^b UNIVERSITY OF MANITOBA   (Canada)

Author keywords

Crystallographic orientation; Kornerupine; Light elements; SIMS; SREF

Indexed keywords

EID: 0013215892     PISSN: 00263672     EISSN: 14365073     Source Type: Journal    
DOI: 10.1007/s006040200050     Document Type: Article

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