Improved determination of matrix compostion of Hg1-xCdxTe by SIMS

Journal of Electronic Materials

Volumn 26, Issue 6, 1997, Pages 588-592

  Sheng, Jack ^a   Wang, Larry ^a   Lux, Gayle E ^a   Gao, Yumin ^a  

^a CHARLES EVANS AND ASSOCIATES   (United States)

Author keywords

Composition analysis; Heterostructure layer thickness calibration; HgCdTe; Secondary ion mass spectrometry (SIMS)

Indexed keywords

EID: 0013181609     PISSN: 03615235     EISSN: None     Source Type: Journal    
DOI: 10.1007/s11664-997-0199-0     Document Type: Article

References (5)

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2. L.O. Bubulac and C.R. Viswanathan, Appl. Phys. Lett. 60 (2), 222 (1992).
3. Y. Gao, J. Appl. Phys. 64 (7), 3760 (1988).
4. S. Hayashi et al., Jpn. J. Appl. Phys. 33, 1169 (1994).
5. Y. Gao, Y. Marie, F. Saldi and H.N. Migeon, Secondary Ion Mass Spectrometry SIMS IX, 382, eds. Bennihoven, Nihei, Shimizu, and Werner, (New York: John Wiley & Sons, 1994).