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Volumn 37, Issue 1-3, 1996, Pages 30-34

Semi-insulating properties control by CVD process modelling

Author keywords

Deposition; Modelisation; Silicon; Silicon oxide

Indexed keywords


EID: 0013114311     PISSN: 09215107     EISSN: None     Source Type: Journal    
DOI: 10.1016/0921-5107(95)01453-5     Document Type: Article
Times cited : (6)

References (10)
  • 5
    • 85029995998 scopus 로고
    • M. Sc. Thesis (Chem. Eng.), University of Massachussets, September
    • F. Communal, M. Sc. Thesis (Chem. Eng.), University of Massachussets, September 1990.
    • (1990)
    • Communal, F.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.