Absolute interferometric measurements with tunable diode lasers;Absolutinterferometrie mit modulierten Halbleiterlasern

Technisches Messen

Volumn 63, Issue 3, 1996, Pages 92-98

  Werle, Peter ^a   Jänker, Bernd ^a  

^a KARLSRUHE INSTITUTE OF TECHNOLOGY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0013110216     PISSN: 01718096     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (26)

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