Performance of a high-resolution, synchrotron-based, small-angle x-ray scattering instrument

Review of Scientific Instruments

Volumn 67, Issue 9, 1996, Pages 3021-3034

  Wilcoxon, J P ^a   Craft, S A ^a   Thurston, T R ^b  

^a SANDIA NATIONAL LABORATORIES   (United States)

^b BROOKHAVEN NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0013107023     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1147424     Document Type: Article

References (16)

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