-
1
-
-
0028594017
-
-
(a) Martin, C. R. Science 1994, 266, 1961.
-
(1994)
Science
, vol.266
, pp. 1961
-
-
Martin, C.R.1
-
3
-
-
0000200710
-
-
(c) Cheng, G. S.; Zhang, L. D.; Zhu, Y.; Fei, G. T.; Li, L.; Mo, C. M.; Mao, Y. Q. Appl. Phys. Lett. 1999, 75, 2455.
-
(1999)
Appl. Phys. Lett.
, vol.75
, pp. 2455
-
-
Cheng, G.S.1
Zhang, L.D.2
Zhu, Y.3
Fei, G.T.4
Li, L.5
Mo, C.M.6
Mao, Y.Q.7
-
4
-
-
0035179645
-
-
(d) Zheng, M.; Li, G.; Zhang, X.; Huang, S.; Lei, Y.; Zhang, L. Chem. Mater. 2001, 13, 3859.
-
(2001)
Chem. Mater.
, vol.13
, pp. 3859
-
-
Zheng, M.1
Li, G.2
Zhang, X.3
Huang, S.4
Lei, Y.5
Zhang, L.6
-
5
-
-
0037581942
-
-
(e) Nielsch, K.; Muller, F.; Li, A.; Gosele, U. Adv. Mater. 2000, 12, 582.
-
(2000)
Adv. Mater.
, vol.12
, pp. 582
-
-
Nielsch, K.1
Muller, F.2
Li, A.3
Gosele, U.4
-
6
-
-
0035899225
-
-
(f) Zhang, X.; Zhang, L.; Meng, G.; Li, G.; Jin-Phillipp, N.; Phillipp, F. Adv. Mater. 2001, 13, 1238.
-
(2001)
Adv. Mater.
, vol.13
, pp. 1238
-
-
Zhang, X.1
Zhang, L.2
Meng, G.3
Li, G.4
Jin-Phillipp, N.5
Phillipp, F.6
-
7
-
-
23444443187
-
-
(g) Huber, C. A.; Huber, T. E.; Sadoqi, M.; Lubin, J. A.; Manalis, S.; Prater, C. B. Science, 1994, 263, 800.
-
(1994)
Science
, vol.263
, pp. 800
-
-
Huber, C.A.1
Huber, T.E.2
Sadoqi, M.3
Lubin, J.A.4
Manalis, S.5
Prater, C.B.6
-
8
-
-
0030130085
-
-
(a) Noel, S.; Batalla, E.; Rochon, P. J. Mater. Res. 1996, 11, 865.
-
(1996)
J. Mater. Res.
, vol.11
, pp. 865
-
-
Noel, S.1
Batalla, E.2
Rochon, P.3
-
9
-
-
0037173285
-
-
(b) Yi, D. K.; Seo, E. M.; Kim, D. Y. Langmuir 2002, 18, 5321.
-
(2002)
Langmuir
, vol.18
, pp. 5321
-
-
Yi, D.K.1
Seo, E.M.2
Kim, D.Y.3
-
10
-
-
0006665412
-
-
(a) Chen, G. S.; Boothroyd, C. B.; Humphreys, C. J. Appl. Phys. Lett. 1993, 62, 1949.
-
(1993)
Appl. Phys. Lett.
, vol.62
, pp. 1949
-
-
Chen, G.S.1
Boothroyd, C.B.2
Humphreys, C.J.3
-
11
-
-
21544449825
-
-
(b) Liu, H. I.; Biegelsen, D. K.; Ponce, F. A.; Johnson, N. M.; Pease, R. F. W. Appl. Phys. Lett. 1994, 64, 1383.
-
(1994)
Appl. Phys. Lett.
, vol.64
, pp. 1383
-
-
Liu, H.I.1
Biegelsen, D.K.2
Ponce, F.A.3
Johnson, N.M.4
Pease, R.F.W.5
-
12
-
-
0028277175
-
-
(c) Wada, Y.; Kure, T.; Yoshimura, T.; Sudo, Y. Jpn. J. Appl. Phys. 1994, 33, 905.
-
(1994)
Jpn. J. Appl. Phys.
, vol.33
, pp. 905
-
-
Wada, Y.1
Kure, T.2
Yoshimura, T.3
Sudo, Y.4
-
13
-
-
0034694710
-
-
(a) Gates, B.; Yin, Y.; Xia, Y. J. Am. Chem. Soc. 2000, 122, 12582.
-
(2000)
J. Am. Chem. Soc.
, vol.122
, pp. 12582
-
-
Gates, B.1
Yin, Y.2
Xia, Y.3
-
15
-
-
0000375989
-
-
(c) Yazawa, M.; Koguchi, M.; Muto, A.; Hiruma, K. Adv. Mater. 1993, 5, 577.
-
(1993)
Adv. Mater.
, vol.5
, pp. 577
-
-
Yazawa, M.1
Koguchi, M.2
Muto, A.3
Hiruma, K.4
-
16
-
-
0033873026
-
-
Zhong, Z.; Yin, Y.; Gates, B.; Xia, Y. Adv. Mater. 2000, 12, 206.
-
(2000)
Adv. Mater.
, vol.12
, pp. 206
-
-
Zhong, Z.1
Yin, Y.2
Gates, B.3
Xia, Y.4
-
17
-
-
0035910455
-
-
Jiang, P.; Bertone, J. F.; Colvin, V. L. Science 2001, 291, 453.
-
(2001)
Science
, vol.291
, pp. 453
-
-
Jiang, P.1
Bertone, J.F.2
Colvin, V.L.3
-
18
-
-
0000907697
-
-
(a) Lakshmi, B. B.; Dorhout, P. K.; Martin, C. R. Chem. Mater. 1997, 9, 857.
-
(1997)
Chem. Mater.
, vol.9
, pp. 857
-
-
Lakshmi, B.B.1
Dorhout, P.K.2
Martin, C.R.3
-
19
-
-
0035899914
-
-
(b) Caruso, R. A.; Schattka, J. H.; Greiner, A. Adv. Mater. 2001, 13, 1577.
-
(2001)
Adv. Mater.
, vol.13
, pp. 1577
-
-
Caruso, R.A.1
Schattka, J.H.2
Greiner, A.3
-
21
-
-
0001431759
-
-
(a) Cheng, J.; Meng, X.; Tang, J.; Guo, S.; Chu, J. Appl. Phys. Lett. 1999, 75, 3402.
-
(1999)
Appl. Phys. Lett.
, vol.75
, pp. 3402
-
-
Cheng, J.1
Meng, X.2
Tang, J.3
Guo, S.4
Chu, J.5
-
22
-
-
0032606208
-
-
(b) Lee, S.; Kang, K.; Han, S. Appl. Phys. Lett. 1999, 75, 1784.
-
(1999)
Appl. Phys. Lett.
, vol.75
, pp. 1784
-
-
Lee, S.1
Kang, K.2
Han, S.3
-
23
-
-
0039189804
-
-
(a) Ye, Y.-H.; Badilescu, S.; Truong, V.-V.; Rochon, P.; Natansohn, A. Appl. Phys. Lett. 2001, 79, 872.
-
(2001)
Appl. Phys. Lett.
, vol.79
, pp. 872
-
-
Ye, Y.-H.1
Badilescu, S.2
Truong, V.-V.3
Rochon, P.4
Natansohn, A.5
-
24
-
-
79955987783
-
-
(b) Yi, D. K.; Seo, E. M.; Kim, D. Y. Appl. Phys. Lett. 2002, 80, 225.
-
(2002)
Appl. Phys. Lett.
, vol.80
, pp. 225
-
-
Yi, D.K.1
Seo, E.M.2
Kim, D.Y.3
-
25
-
-
0037133879
-
-
(c) Yi, D. K.; Kim, M. J.; Kim, D. Y. Langmuir 2002, 18, 2019.
-
(2002)
Langmuir
, vol.18
, pp. 2019
-
-
Yi, D.K.1
Kim, M.J.2
Kim, D.Y.3
-
26
-
-
0029637530
-
-
(a) Kim, D. Y.; Tripathy, S. K.; Kumar, J.; Li, L. Appl. Phys. Lett. 1995, 66, 1166.
-
(1995)
Appl. Phys. Lett.
, vol.66
, pp. 1166
-
-
Kim, D.Y.1
Tripathy, S.K.2
Kumar, J.3
Li, L.4
-
27
-
-
36449005000
-
-
(b) Rochon, P.; Batalla, E.; Natansohn, A. Appl. Phys. Lett. 1995, 66, 136.
-
(1995)
Appl. Phys. Lett.
, vol.66
, pp. 136
-
-
Rochon, P.1
Batalla, E.2
Natansohn, A.3
-
28
-
-
0346792397
-
-
A similar mechanism was proposed by Bomside, D. E. J. Electrochem. Soc. 1990, 137, 2589. Compared with Bornside, the spinning rate was fixed at 3500 rpm in our experiment. Therefore, available time for titanium isopropoxide to diffuse is dependent on the 2-propanol content.
-
(1990)
J. Electrochem. Soc.
, vol.137
, pp. 2589
-
-
Bomside, D.E.1
-
29
-
-
0348053375
-
-
note
-
The four-point electrodes on the film surface were in line at an equal spacing of 1 mm. An appropriate current (ranged from 1 nA to 10 mA) was maintained on two outer electrodes. The potential between two inner electrodes was measured to determine the conductivity.
-
-
-
-
30
-
-
0348053376
-
-
note
-
1.6.
-
-
-
-
31
-
-
0344203040
-
-
McGraw-Hill: New York
-
Edited by the staff of Modern Plastics Magazine, Plastics Handbook, McGraw-Hill: New York, 1994.
-
(1994)
Plastics Handbook
-
-
-
32
-
-
0024626558
-
-
Because the adhesion is weak, the critical gel thickness beyond which cracking occurs decreases. Hu, M. S.; Evans, A. G. Acta Metal. 1989, 37, 917, proposed that decohesion of the film from the substrate permits the relaxation of strain energy over a larger area than for a firmly adherent film. Therefore, large crack openings were observed in thin film, 80 nm.
-
(1989)
Acta Metal.
, vol.37
, pp. 917
-
-
Hu, M.S.1
Evans, A.G.2
-
33
-
-
0003638901
-
-
McGraw-Hill: NewYork
-
The nonreacted residual sol in the pores of the gel network could be carried by residual 2-propanol across the crack during gel shrinkage, and the stretched sol forms wires via gelation. Only small amounts of 2-propanol remain to carry the titanium isopropoxide across the crack when the 2-propanol content is low (1: 20 ∼ 1: 1 v/v) 2-propanol evaporated rapidly, due its high vapor pressure, ∼ 45.16 mmHg at 25°C. (see (a) Dean, J. A. Lange's Handbook of Chemistry; McGraw-Hill: NewYork, 1992), and air shear forces (see (b) Middleman, S. J. Appl Phys. 1987, 62, 2530, and (c) Chou, F. C.; Wu, P. Y. J. Electrochem. Soc. 2000,147, 699) during the spin-on. And the wire formation is limited.
-
(1992)
Lange's Handbook of Chemistry
-
-
Dean, J.A.1
-
34
-
-
0000813922
-
-
The nonreacted residual sol in the pores of the gel network could be carried by residual 2-propanol across the crack during gel shrinkage, and the stretched sol forms wires via gelation. Only small amounts of 2-propanol remain to carry the titanium isopropoxide across the crack when the 2-propanol content is low (1: 20 ∼ 1: 1 v/v) 2-propanol evaporated rapidly, due its high vapor pressure, ∼ 45.16 mmHg at 25°C. (see (a) Dean, J. A. Lange's Handbook of Chemistry; McGraw-Hill: NewYork, 1992), and air shear forces (see (b) Middleman, S. J. Appl Phys. 1987, 62, 2530, and (c) Chou, F. C.; Wu, P. Y. J. Electrochem. Soc. 2000,147, 699) during the spin-on. And the wire formation is limited.
-
(1987)
J. Appl Phys.
, vol.62
, pp. 2530
-
-
Middleman, S.1
-
35
-
-
0034140987
-
-
The nonreacted residual sol in the pores of the gel network could be carried by residual 2-propanol across the crack during gel shrinkage, and the stretched sol forms wires via gelation. Only small amounts of 2-propanol remain to carry the titanium isopropoxide across the crack when the 2-propanol content is low (1: 20 ∼ 1: 1 v/v) 2-propanol evaporated rapidly, due its high vapor pressure, ∼ 45.16 mmHg at 25°C. (see (a) Dean, J. A. Lange's Handbook of Chemistry; McGraw-Hill: NewYork, 1992), and air shear forces (see (b) Middleman, S. J. Appl Phys. 1987, 62, 2530, and (c) Chou, F. C.; Wu, P. Y. J. Electrochem. Soc. 2000,147, 699) during the spin-on. And the wire formation is limited.
-
(2000)
J. Electrochem. Soc.
, vol.147
, pp. 699
-
-
Chou, F.C.1
Wu, P.Y.2
|