Nonlinearity measures for a class of SISO nonlinear systems

Proceedings of the American Control Conference

Volumn 4, Issue , 1998, Pages 2544-2548

  Sun, Debin ^a   Kosanovich, Karlene A ^a  

^a University of South Carolina   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CONTROLLER DESIGNS; INPUT/OUTPUT BEHAVIORS; MEASURE OF NONLINEARITIES; NONLINEARITY MEASURES;

CONTROLLERS; LINEAR SYSTEMS;

NONLINEAR SYSTEMS;

EID: 0013070780     PISSN: 07431619     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ACC.1998.703093     Document Type: Conference Paper

References (10)

1. C. A. Desoer and Y. T. Wang. Pundations of feedback theory for nonlinear dynamical systems. IEEE Trans. Circ. Syst., 27(2):104-123, 1980.
2. M. Nikolaou. When is nonlinear dynamic modeling necessary? In Proc. Amer. Control Conf., pages 1460-1464, 1993. San Franciso, CA.
3. F. Allgöwer. Definition and computation of a non-linearity measure and application to approximate i/o-linearization. Tech. Rep. 95-1, Stuggart Univ., Stuttgart, Germany, 1995.
4. R. Haber. Nonlinearity test for dynamic processes. In Proc. 7th IFAC/IFIP Identification and System Parameter Estimation Symp., pages 409-414, 1985. York, UK.
5. M. Guay, P. McLellan, and D. Bacon. Measurement of nonlinearity in chemical process control systems: The steady state map. Can. J. Chem. Eng., 73(12):868-882, 1995.
6. A. J. Stack and F. J. Doyle III. Application of a control-law nonlinearity measure to the chemical reactor analysis. AIChE J., 43(2):425-439, 1997.
7. V. M. Popov. Hyperstability of Control Systems. Springer-Verlag, New York, 1973.
8. G. Zames. On the input-output stability of time-varying nonlinear feedback systems part II: Conditions involving circles in the frequency plane and sectior nonlinearity. IEEE TRans. Circ. Sys., 11(3), 1966.
9. B. A. Ogunnaike and W. H. Ray. Process Dynamics, Modeling, and Control. Oxford University Press, Oxford, New York, 1994.
10. K. A. Kosanovich, A. R. Moser, and M. J. Piovoso. Poisson wavelet applied to model identification. J. Proc. Cont., 5(4):225-234, 1995.