Using accelerated tests to predict service life in highly variable environments

ACS Symposium Series

Volumn 805, Issue , 2002, Pages 396-413

  Meeker, William Q ^a   Escobar, Luis A ^b   Chan, Victor ^a  

^a Department of Statistics Center for Statistics and Applications in Forensic Evidence Iowa State University 2438 Osborn Dr Ames   (United States)

^b LOUISIANA STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0012965284     PISSN: 00976156     EISSN: None     Source Type: Book Series    
DOI: None     Document Type: Article

References (8)

1. Hooper, J. H., and Amster, S. J. (1990), "Analysis and presentation of reliability data," in Handbook of Statistical Methods for Engineers and Scientists, Harrison M. Wadsworth, Editor. New York: McGraw Hill.
2. Jorgensen, G. J., Kim, H. M., and Wendelin, T. J. (1996), "Durability studies of solar reflector materials exposed to environmental stresses," Durability Testing of Non-Metallic Materials, Herling, R. J., Ed., ASTM STP 1294, American Society for Testing and Materials, Philadelphia, PA, 121-135.
3. Martin, J. W. (1999), "A Systems Approach to the Service Life Prediction Problem for Coating Systems," in A Systems Approach to Service Life Prediction of Organic Coatings Washington: American Chemical Society, D. R. Bauer and J. W. Martin, Editors.
4. Martin, J. W., Saunders, S. C., Floyd, F. L., and Wineburg, J. P. (1996), "Methodologies for predicting the service lives of coating systems," Blue Bell, PA: Federation of Societies for Coatings Technology.
5. Meeker, W. Q., and Escobar, L. A. (1998), Statistical Methods for Reliability Data. John Wiley & Sons: New York.
6. Meeker, W.Q. and Escobar, L.A. (1999), "Accelerated Life Tests: Concepts and Data Analysis," in A Systems Approach to Service Life Prediction of Organic Coatings Washington: American Chemical Society, D. R. Bauer and J. W. Martin, Editors.
7. Meeker, W.Q., Escobar, L.A., and Lu, C.J. (1998), "Accelerated Degradation Tests: Modeling and Analysis." Technometrics 40, 89-99.
8. Nelson, W. (1990), Accelerated Testing: Statistical Models, Test Plans, and Data Analyses, John Wiley & Sons: New York.