Structure analysis of two-dimensional Holmium silicide by low energy electron diffraction

Surface Science

Volumn 482-485, Issue PART 2, 2001, Pages 1481-1486

  Kitayama, H ^a   Tear, S P ^b   Spence, D J ^b   Urano, T ^a  

^a KOBE UNIVERSITY   (Japan)

^b UNIVERSITY OF YORK   (United Kingdom)

Author keywords

Lanthanides; Low energy electron diffraction (LEED); Silicides

Indexed keywords

EID: 0012909451     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(01)00859-7     Document Type: Article

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