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Volumn 53, Issue 17, 1996, Pages 11365-11368

Depth profiles of interstitial halogen defects in high-energy ion-bombarded RbI by micro-Raman spectroscopy

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EID: 0012907554     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.53.11365     Document Type: Article
Times cited : (9)

References (22)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.