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Volumn 53, Issue 17, 1996, Pages 11365-11368
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Depth profiles of interstitial halogen defects in high-energy ion-bombarded RbI by micro-Raman spectroscopy
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Author keywords
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Indexed keywords
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EID: 0012907554
PISSN: 10980121
EISSN: 1550235X
Source Type: Journal
DOI: 10.1103/PhysRevB.53.11365 Document Type: Article |
Times cited : (9)
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References (22)
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