Influence of the stiffness of the measurement system on the elastic adhesional contact

Journal of Adhesion Science and Technology

Volumn 9, Issue 11, 1995, Pages 1451-1464

  Takahashi, Kunio ^a   Mizuno, Ryoji ^a   Onzawa, Tadao ^a  

^a TOKYO INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

Adhesion; atomic force microscopy; continuum theory; elastic contact; force curve; hysteresis; stiffness

Indexed keywords

EID: 0012905487     PISSN: 01694243     EISSN: 15685616     Source Type: Journal    
DOI: 10.1163/156856195X00121     Document Type: Article

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