메뉴 건너뛰기




Volumn 56, Issue 4, 1997, Pages 1834-1847

Electronic structure, chemical bonding, and hyperfine parameters in layered silicates

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0012889790     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.56.1834     Document Type: Article
Times cited : (13)

References (60)
  • 11
    • 35949010303 scopus 로고
    • Yong-nian Xu and W. Y. Ching, Phys. Rev. B 44, 11 048 (1991).
    • (1991) Phys. Rev. B , vol.44 , pp. 11048
    • Ching, W.1
  • 14
    • 85037920343 scopus 로고
    • 14, 364 (1987).
    • (1987) , vol.14 , pp. 364
  • 15
    • 0025257701 scopus 로고
    • Am. Mineral. 75, 256 (1990).
    • (1990) Am. Mineral. , vol.75 , pp. 256
  • 27
    • 0642324978 scopus 로고
    • R. F. Giese, Jr., in Reviews in Mineralogy, edited by S. W. Bailey (Mineralogical Society of America, 1984), Vol. 13, p. 104.
    • (1984) Reviews in Mineralogy , vol.13 , pp. 104
    • Giese, R.1
  • 55
  • 58


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.