Resistive destabilization of cycloidal electron flow and universality of (near-) Brillouin flow in a crossed-field gap

Physics of Plasmas

Volumn 3, Issue 12, 1996, Pages 4455-4462

  Christenson, Peggy J ^a,b   Chernin, David P ^a,c   Garner, Allen L ^a   Lau, Y Y ^a  

^a UNIVERSITY OF MICHIGAN   (United States)

^b UNIVERSITY OF CALIFORNIA   (United States)

^c SCIENCE APPLICATIONS INTERNATIONAL CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0012873698     PISSN: 1070664X     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.872064     Document Type: Article

References (22)

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2. P. J. Christenson and Y. Y. Lau, Phys. Plasmas 1, 3725 (1994); ibid. Erratum: 3, 4293 (1996).
3. P. J. Christenson and Y. Y. Lau, Phys. Plasmas 1, 3725 (1994); ibid. Erratum: 3, 4293 (1996).
4. H, the critical current density is NOT achieved under the space charge limited condition of the zero surface electric field. However, the current density computed under the assumption of the zero surface electric field, as done in Ref. 2, still gives a good estimate. See Ref. 4 for more detail. The "critical"current under the zero electric field assumption for the relativistic regime is given by R. V. Lovelace and E. Ott, Phys. Fluids 17, 1263 (1974), while Ron et al. (Ref. 5) did not invoke such an assumption.
5. P. J. Christenson, Ph.D. thesis, University of Michigan, Ann Arbor, 1996.
6. A. Ron, A. A. Mondelli, and N. Rostoker, IEEE Trans. Plasma Sci. PS-1, 85 (1973).
7. L. Brillouin, Phys. Rev. 67, 260 (1945).
8. P. J. Christenson and Y. Y. Lau, Phys. Rev. Lett. 76, 3324 (1996).
9. See, e.g., R. C. Davidson, Physics of Nonneutral Plasmas (Addison-Wesley, Redwood City, CA, 1990); J. D. Lawson, Physics of Charged Panicle Beams (Oxford University Press, Oxford, 1988).
10. See, e.g., R. C. Davidson, Physics of Nonneutral Plasmas (Addison-Wesley, Redwood City, CA, 1990); J. D. Lawson, Physics of Charged Panicle Beams (Oxford University Press, Oxford, 1988).
11. O. W. Richardson, Proc. Cambridge Philos. Soc. 11, 286 (1901); S. Dushman, Phys. Rev. 20, 623 (1923).
12. O. W. Richardson, Proc. Cambridge Philos. Soc. 11, 286 (1901); S. Dushman, Phys. Rev. 20, 623 (1923).
13. PDPI (Plasma Device Planar 1 Dimensional), Copyright 1990-1993 Regents of the University of California, Plasma Theory and Simulation Group, Berkeley, CA. Available from Software Distribution Office of ILP, 205 Cory Hall, Berkeley, CA 94720; Electronic mail: software@eecs.berkeley.edu. This is a one-dimensional code that includes all three components of velocity.
14. S. Ramo, Proc. IRE 27, 584 (1939); see also, M. V. Chodorow and C. Susskind, Fundamentals of Microwave Electronics (McGraw-Hill, New York, 1965).
15. S. Ramo, Proc. IRE 27, 584 (1939); see also, M. V. Chodorow and C. Susskind, Fundamentals of Microwave Electronics (McGraw-Hill, New York, 1965).
16. C. K. Birdsall and W. B. Bridges, Electron Dynamics of Diode Regions (Academic, New York, 1966).
17. Y. Y. Lau, P. J. Christenson, and D. Chemin, Phys. Fluids B 5, 4486 (1993).
18. A. Palevsky, G. Bekefi, and A. Drobot, J. Appl. Phys. 52, 4938 (1981).
19. D. Chemin, A. Drobot, G. Hilfer, M. Kess, and S. Riyopoulos, in Digest of IEEE International Electron Devices Meeting (Institute of Electrical and Electronic Engineers, New York, 1991), IEEE Cat. No. 91CH3075-9, p. 593; G. E. Dombrowski, IEEE Trans. Electron Devices ED-35, 2060 (1988); R. MacGregor, C. Chan, J. Ye, and T. Ruden, IEEE Trans. Electron Devices, ED-41, 1456 (1994).
20. D. Chemin, A. Drobot, G. Hilfer, M. Kess, and S. Riyopoulos, in Digest of IEEE International Electron Devices Meeting (Institute of Electrical and Electronic Engineers, New York, 1991), IEEE Cat. No. 91CH3075-9, p. 593; G. E. Dombrowski, IEEE Trans. Electron Devices ED-35, 2060 (1988); R. MacGregor, C. Chan, J. Ye, and T. Ruden, IEEE Trans. Electron Devices, ED-41, 1456 (1994).
21. D. Chemin, A. Drobot, G. Hilfer, M. Kess, and S. Riyopoulos, in Digest of IEEE International Electron Devices Meeting (Institute of Electrical and Electronic Engineers, New York, 1991), IEEE Cat. No. 91CH3075-9, p. 593; G. E. Dombrowski, IEEE Trans. Electron Devices ED-35, 2060 (1988); R. MacGregor, C. Chan, J. Ye, and T. Ruden, IEEE Trans. Electron Devices, ED-41, 1456 (1994).
22. See, e.g., P. G. Drazin, Nonlinear Systems (Cambridge University Press, Cambridge, 1992).