SCOPUS 정보 검색 플랫폼

Volumn 8, Issue 12, 2001, Pages 649-654

Enhancement of surface inspection by Moiré interferometry using flexible reference gratings

Author keywords

[No Author keywords available]

Indexed keywords

CALIBRATION; CAMERAS; CHARGE COUPLED DEVICES; COLOR; DIFFRACTION GRATINGS; LIGHT MODULATION; MOIRE FRINGES; VISION;

INDUSTRIAL INSPECTION; MOIRÉ TECHNIQUE; OPTICAL INSPECTION; SURFACE MEASUREMENTS, FIGURE; VISION AND COLOR;

INTERFEROMETRY;

EID: 0012869286 PISSN: 10944087 EISSN: None Source Type: Journal
DOI: 10.1364/OE.8.000649 Document Type: Article

Times cited : (14)

References (15)

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2
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3
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4
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5
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- Moire topography
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- Takasaki, H.¹

6
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- Moire gauging by projected interference fringes
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- Shamir, J.¹

7
- 0001134178
- Surface topography of non-optical surfaces by projected interference fringes
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8
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- Three-map absolute moire contouring
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- Xinjun, X.¹ Atkinson, J.T.² Lalor, M.J.³ Burton, D.R.⁴

9
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- Three-dimensional shape reconstruction by phase-shifting shadow moire
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10
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- Shadow and projection moire techniques for absolute or relative mapping of surface shapes
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11
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12
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- Shadow moire contouring of impact craters
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13
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- Use of a curved grating in shadow Moiré
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14
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15
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- E. A. Patterson, M. Heredia, internal communication, European project "INDUCE" ref. BRPR-CT98-0805

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.