Comparison of soft-breakdown triggers for large-area capacitors under constant voltage stress

IEEE Transactions on Device and Materials Reliability

Volumn 1, Issue 3, 2001, Pages 150-157

  Schmilz, Jurriaan ^a   Tuinhout, Hans P ^a   Kretschmann, Hennie J ^a   Woerlee, Pierre H ^a  

^a PHILIPS RESEARCH LABORATORIES   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0012854580     PISSN: 15304388     EISSN: 15304388     Source Type: Journal    
DOI: 10.1109/7298.974830     Document Type: Article

References (10)

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