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Volumn 2909, Issue , 1997, Pages 89-97
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Comparison of surface contour measurements based on speckle pattern sampling and coordinate measuring machines
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Author keywords
[No Author keywords available]
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Indexed keywords
CAMERAS;
CHARGE COUPLED DEVICES;
CONTOUR MEASUREMENT;
COORDINATE MEASURING MACHINES;
FAST FOURIER TRANSFORMS;
FOURIER TRANSFORMS;
IMAGING SYSTEMS;
IMAGING TECHNIQUES;
MEASUREMENTS;
SCANNING;
SHEET METAL;
SMELTING;
SPECKLE;
THREE DIMENSIONAL;
3D IMAGING TECHNIQUES;
EXTERNAL CAVITY TUNABLE DIODE LASERS;
FREQUENCY SCANS;
HEIGHT PROFILES;
INTENSITY PATTERNS;
LASER FREQUENCIES;
METAL PARTS;
NON CONTACTS;
QUANTITATIVE COMPARISONS;
RANGE RESOLUTIONS;
SCATTERING OBJECTS;
SPECKLE PATTERNS;
SPEED OF LIGHTS;
STANDARD DEVIATIONS;
TUNABLE LASERS;
LASERS;
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EID: 0012804730
PISSN: 0277786X
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1117/12.263314 Document Type: Conference Paper |
Times cited : (6)
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References (7)
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