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Volumn 96, Issue 1, 2000, Pages 155-182

The spurious regression of fractionally integrated processes

Author keywords

Fractionally integrated processes; Long memory; Spurious detrending; Spurious regression

Indexed keywords


EID: 0012798871     PISSN: 03044076     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-4076(99)00056-1     Document Type: Article
Times cited : (84)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.