System-level functional testing for scaled prototypes with configurational distortions

Proceedings of the ASME Design Engineering Technical Conference

Volumn 1, Issue , 1999, Pages 587-600

  Cho, Uichung ^a   Wood, Kristin L ^a   Crawford, Richard H ^a  

^a The University of Texas at Austin   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER AIDED DESIGN;

DESIGN INFORMATION; EMPIRICAL SIMILARITY METHOD; FUNCTIONAL TESTING; HIGH-QUALITY PRODUCTS; INDUSTRIAL BENEFITS; MULTIPLE MATERIALS; PHYSICAL PHENOMENA; PRODUCT DEVELOPMENT PROCESS;

PRODUCT DESIGN;

EID: 0012794428     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1115/DETC99/DAC-8606     Document Type: Conference Paper

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