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Volumn 87, Issue 7, 2000, Pages 3478-3482

High-quality Si-implanted In0.53Ga0.47As epitaxial layers and their application to n+ p junction devices

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0012753672     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.372369     Document Type: Article
Times cited : (5)

References (30)
  • 17
    • 85037451876 scopus 로고    scopus 로고
    • note
    • Epitaxial Products International Ltd., Cypress Drive, St. Mellons, Cardiff, CF3 0EG, UK.
  • 22
    • 3242837376 scopus 로고
    • edited by T. P. Pearsall Wiley, New York, Chap. 9
    • Y. Takeda, in GaInAsP Alloy Semiconductors, edited by T. P. Pearsall (Wiley, New York, 1982), Chap. 9, p. 227.
    • (1982) GaInAsP Alloy Semiconductors , pp. 227
    • Takeda, Y.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.