-
1
-
-
84925486651
-
Two-wavelength phase shifting interferometry
-
Y.-Y. Cheng and J. C. Wyant, “Two-wavelength phase shifting interferometry,” Appl. Opt. 23, 4539-4543 (1984).
-
(1984)
Appl. Opt.
, vol.23
, pp. 4539-4543
-
-
Cheng, Y.-Y.1
Wyant, J.C.2
-
2
-
-
84893989530
-
Sub-Nyquist interferometry
-
J. E. Greivenkamp, “Sub-Nyquist interferometry,” Appl. Opt. 26, 5245-5258 (1987).
-
(1987)
Appl. Opt.
, vol.26
, pp. 5245-5258
-
-
Greivenkamp, J.E.1
-
3
-
-
84958515180
-
Sub-Nyquist interferometry: Results and implementation issues
-
R. J. Palum and J. E. Greivenkamp, “Sub-Nyquist interferometry: results and implementation issues,” in Laser Inter ferometry: Qualitative Analysis of Interferograms: Third in a Series, J. E. Wampler, ed., Proc. SPIE 1162, 378-388 (1989).
-
(1989)
Laser Inter Ferometry: Qualitative Analysis of Interferograms: Third in a Series
, vol.1162
, pp. 378-388
-
-
Palum, R.J.1
Greivenkamp, J.E.2
-
4
-
-
0001517360
-
Sub-Nyquist interferometry: Implementation and measurement capability
-
J. E. Greivenkamp, A. E. Lowman, and R. J. Palum, “Sub-Nyquist interferometry: implementation and measurement capability,” Opt. Eng. 35, 2962-2969 (1996).
-
(1996)
Opt. Eng.
, vol.35
, pp. 2962-2969
-
-
Greivenkamp, J.E.1
Lowman, A.E.2
Palum, R.J.3
-
5
-
-
0032650220
-
Optical Vernier interferometry for aspheric metrology
-
Y. Vladimirsky, ed., Proc. SPIE
-
P. E. Murphy, T. G. Brown, and D. T. Moore, “Optical Vernier interferometry for aspheric metrology,” in Emerging Lithographic Technologies III, Y. Vladimirsky, ed., Proc. SPIE 3676, 643-652 (1999).
-
(1999)
Emerging Lithographic Technologies III
, vol.3676
, pp. 643-652
-
-
Murphy, P.E.1
Brown, T.G.2
Moore, D.T.3
-
6
-
-
0028757125
-
Interferometer induced wavefront errors when testing in a non-null configuration
-
G. M. Brown, and W. E. Jeuptner, eds., Proc. SPIE
-
A. E. Lowman and J. E. Greivenkamp, “Interferometer induced wavefront errors when testing in a non-null configuration,” in Interferometry VI: Applications, R. J. Pryptniewicz, G. M. Brown, and W. E. Jeuptner, eds., Proc. SPIE 2004, 173-181 (1993).
-
(1993)
Interferometry VI: Applications
, vol.2004
, pp. 173-181
-
-
Lowman, A.E.1
Greivenkamp, J.E.2
-
7
-
-
0029521796
-
Modeling an interferometer for non-null testing of aspheres
-
V. J. Daugherty and H. Stabl, eds., Proc. SPIE
-
A. E. Lowman and J. E. Greivenkamp, “Modeling an interferometer for non-null testing of aspheres,” in Optical Manufacturing and Testing, V. J. Daugherty and H. Stabl, eds., Proc. SPIE 2536, 139-147 (1995).
-
(1995)
Optical Manufacturing and Testing
, vol.2536
, pp. 139-147
-
-
Lowman, A.E.1
Greivenkamp, J.E.2
-
8
-
-
0027151167
-
Compensation for errors introduced by non-zero fringe densities in phase-measuring interferometers
-
C. J. Evans, “Compensation for errors introduced by non-zero fringe densities in phase-measuring interferometers,” CIRP Annals 42/1, 577-580 (1993).
-
(1993)
CIRP Annals
, vol.42
, Issue.1
, pp. 577-580
-
-
Evans, C.J.1
-
9
-
-
0038278735
-
Software based improvements in the accuracy of measurement of aspherics using a Fizeau interferometer
-
of 1994 OSA Technical Digest Series (Optical Society of America, Washington, D.C
-
C. J. Evans, “Software based improvements in the accuracy of measurement of aspherics using a Fizeau interferometer,” Optical Fabrication and Testing, Vol. 13 of 1994 OSA Technical Digest Series (Optical Society of America, Washington, D.C., 1994), pp. 259-267.
-
(1994)
Optical Fabrication and Testing
, vol.13
, pp. 259-267
-
-
Evans, C.J.1
-
10
-
-
58749116864
-
Measurements of the LIGO Pathfinder optics
-
H. Stahl, ed., Proc. SPIE
-
R. E. Parks, C. J. Evans, P. J. Sullivan, L. Z. Shao, and B. Loucks, “Measurements of the LIGO Pathfinder optics,” in Optical Manufacturing and Testing II, H. Stahl, ed., Proc. SPIE 3134, 95-111 (1997).
-
(1997)
Optical Manufacturing and Testing I
, vol.3134
, pp. 95-111
-
-
Parks, R.E.1
Evans, C.J.2
Sullivan, P.J.3
Shao, L.Z.4
Loucks, B.5
-
11
-
-
0022938154
-
Influence of system aberrations on interferometric aspheric surface testing
-
L. G. DeShazer, ed., Proc. SPIE
-
H. Kurita, K. Saito, M. Kato, and T. Yatagai, “Influence of system aberrations on interferometric aspheric surface testing,” in Laser and Nonlinear Optical Materials, L. G. DeShazer, ed., Proc. SPIE 680, 47-52 (1987).
-
(1987)
Laser and Nonlinear Optical Materials
, vol.680
, pp. 47-52
-
-
Kurita, H.1
Saito, K.2
Kato, M.3
Yatagai, T.4
-
12
-
-
0027883379
-
Propagation errors in precision Fizeau interferom-etry
-
C. Huang, “Propagation errors in precision Fizeau interferom-etry,” Appl. Opt. 32, 7016-7021 (1993).
-
(1993)
Appl. Opt.
, vol.32
, pp. 7016-7021
-
-
Huang, C.1
-
13
-
-
0001599903
-
Interference imaging for aspheric surface testing
-
P. E. Murphy, T. G. Brown, and D. T. Moore, “Interference imaging for aspheric surface testing,” Appl. Opt. 39, 2122-2129 (2000).
-
(2000)
Appl. Opt.
, vol.39
, pp. 2122-2129
-
-
Murphy, P.E.1
Brown, T.G.2
Moore, D.T.3
-
15
-
-
0032597695
-
Robust, accurate seven-sample phase-shifting algorithm insensitive to nonlinear phase-shift error and second-harmonic distortion: A com parative study
-
H. Zhang, M. J. Lalor, and D. R. Burton, “Robust, accurate seven-sample phase-shifting algorithm insensitive to nonlinear phase-shift error and second-harmonic distortion: a com parative study,” Opt. Eng. 38, 1524-1533 (1999).
-
(1999)
Opt. Eng.
, vol.38
, pp. 1524-1533
-
-
Zhang, H.1
Lalor, M.J.2
Burton, D.R.3
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