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Volumn 100, Issue 6, 2002, Pages 92-97
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Key factors in the UV curing process-the relationship of exposure conditions and measurement in UV process design and process control-part II: Lamp systems
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Author keywords
[No Author keywords available]
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Indexed keywords
CURING;
DEGRADATION;
ELECTRODES;
ELECTRONS;
MAGNETRONS;
MERCURY VAPOR LAMPS;
MICROWAVE MEASUREMENT;
MIRRORS;
PLASMA COLLISION PROCESSES;
PROCESS CONTROL;
PRODUCT DESIGN;
QUARTZ APPLICATIONS;
EXPOSURE CONDITIONS;
LAMP SYSTEMS;
MICROWAVE POWERED LAMPS;
ULTRAVIOLET CURING;
ULTRAVIOLET LAMPS;
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EID: 0012743347
PISSN: 00260576
EISSN: None
Source Type: Journal
DOI: 10.1016/S0026-0576(02)80444-5 Document Type: Article |
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Times cited : (4)
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References (0)
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