Development of novel ion-energy spectrometer using a semiconductor collector under a circumstance of simultaneously incident ions and electrons with x rays

Fusion Technology

Volumn 39, Issue 1 T, 2001, Pages 281-284

  Hirata, M ^a   Sasuga, T ^a   Cho, T ^a   Kohagura, J ^a   Yoshida, M ^a   Nishizawa, Y ^a   Nagashima, S ^a   Numakura, T ^a   Minami, R ^a   Ito, H ^a   Watanabe, H ^a   Kondoh, T ^b   Nakashima, Y ^a   Yatsu, K ^a   Miyoshi, S ^a  

^a UNIVERSITY OF TSUKUBA   (Japan)

^b JAPAN ATOMIC ENERGY AGENCY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROSTATICS; ION BEAMS; METAL DETECTORS; PLASMA DIAGNOSTICS; QUANTUM EFFICIENCY; SPECTROMETERS;

ION ENERGY SPECTROMETER; SEMICONDUCTOR DETECTORS;

PLASMA DEVICES;

EID: 0012680732     PISSN: 07481896     EISSN: None     Source Type: Journal    
DOI: 10.13182/fst01-a11963461     Document Type: Article

References (10)

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3. M. Hirata et al., J. Electron Spectrosc. Relat. Phenom., 80, 275 (1996).
4. T. Cho et al., Nucl. Instrum. Method, A348, 475 (1994).
5. T. Cho et al., Rev. Sci. Instrum., 70, 578 (1999).
6. J. A. Wesson et al., Phys. Rev. Lett., 79, 5018 (1997).
7. B. Alper et al., Rev. Sci. Instrum., 68, 778 (1997).
8. W. J. Price, Nuclear Radiation Detection, McGraw-Hill, New York (1964).
9. T. Cho et al., Rev. Sci. Instrum., 66, 543 (1995)
10. Y. Sakamoto et al., Rev. Sci. Instrum., 66, 4928 (1995).