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Journal of Applied Physics

Volumn 69, Issue 11, 1991, Pages 7601-7604

Electromigration failure

(1) Lloyd, J R a

a HEWLETT PACKARD COMPANY (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0012679538 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.347529 Document Type: Article

Times cited : (97)

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- Towner, J.M.¹ van der Ven, E.P.²

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.