Effects of vacuum conditions on low frequency noise in silicon field emission devices

Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures

Volumn 15, Issue 2, 1997, Pages 401-404

  Trujillo, Johann T ^a   Chakhovskoi, Andrei G ^a   Hunt, Charles E ^a  

^a University of California Davis   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0012604604     PISSN: 10711023     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.589326     Document Type: Article

References (8)

1. M. E. Malinowski, K. D. Stewart, D. A. A. Ohlberg, T. E. Felter, A. G. Chakhovskoi, C. E. Hunt, L. E. Shea, B. E. Russ, J. B. Talbot, and J. McKittrick, Technical Digest IVMC'95, Eighth International Vacuum Microelectronics Conference, Portland, Oregon, July 30-Aug. 3, 1995, pp. 202-206.
2. R. Z Bakhtizin, S. S. Ghots, and R. N. Amirkhanov, 7th International Vacuum Microelectronics Conference, Revue Le Vide, les Couches Minces-Supplément au No. 271, March-April, 1994, pp. 203-206.
3. J. T. Trujillo, A. G. Chakhovskoi, and C. E. Hunt, in Ref. 1, pp. 42-46.
4. P. J. Fish, Electronic Noise and Low Noise Design (McGraw-Hill, San Francisco, 1994), pp. 88-89.
5. M. J. Buckingham, Noise in Electronic Devices and Systems (Wiley, New York, 1983). pp. 180-200.
6. J. T. Trujillo, A. G. Chakhovskoi, and C. E. Hunt, J. Vac. Sci. Technol. B (submitted).
7. H. H. Busta, B. J. Zimmerman, and J. E. Pogemiller, J. Micromech. Microeng. 4, 60 (1994).
8. H. H. Busta, J. E. Pogemiller, and B. J. Zimmerman, J. Vac. Sci. Technol. B 12, 689 (1994).