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Volumn 58, Issue 23, 1998, Pages 15614-15619
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Evidence for two distinct defects contributing to the deep-level transient spectroscopy peak in electron-irradiated InP
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0012581199
PISSN: 10980121
EISSN: 1550235X
Source Type: Journal
DOI: 10.1103/PhysRevB.58.15614 Document Type: Article |
Times cited : (9)
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References (20)
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