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Volumn 58, Issue 23, 1998, Pages 15614-15619

Evidence for two distinct defects contributing to the deep-level transient spectroscopy peak in electron-irradiated InP

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EID: 0012581199     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.58.15614     Document Type: Article
Times cited : (9)

References (20)
  • 20


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.