Screening test of adsorbents for recovery of krypton

Journal of Nuclear Science and Technology

Volumn 37, Issue 1, 2000, Pages 84-89

  Munakata, Kenzo ^a   Yamatsuki, Satoshi ^a   Tanaka, Kenji ^b   Fukumatsu, Teruki ^a  

^a KYUSHU UNIVERSITY   (Japan)

^b MITSUBISHI ELECTRIC CORPORATION   (Japan)

Author keywords

Adsorbents; Adsorption; Krypton 85; Mordenite; Nitrogen; Reprocessing; Screening; Temperature dependence; Temperature range 195 273 K

Indexed keywords

EID: 0012505419     PISSN: 00223131     EISSN: None     Source Type: Journal    
DOI: 10.1080/18811248.2000.9714870     Document Type: Article

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