Temperature dependent leakage currents in polycrystalline silicon thin film transistors

Journal of Applied Physics

Volumn 81, Issue 12, 1997, Pages 8084-8090

  Kim, Chul Ha ^a   Sohn, Ki Soo ^a   Jang, Jin ^b  

^a Kyungpook National University   (South Korea)

^b Kyung Hee University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0012498210     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.365416     Document Type: Article

References (16)

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