Morphology and optoelectronic properties of nanocrystalline electronic junctions

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3469, Issue , 1998, Pages 134-144

  Shklover, Valery ^a   Grätzel, Michael ^b  

^a ETH ZURICH   (Switzerland)

^b EPFL   (Switzerland)

Author keywords

Electron microscopy; Morphology; Nanocrystals; Optoelectronics; Photovoltaics; Sensitizers; Thin films

Indexed keywords

DYE-SENSITIZED SOLAR CELLS; ELECTRON MICROSCOPY; NANOCRYSTALS; OPTOELECTRONIC DEVICES; ORGANIC-INORGANIC MATERIALS; THIN FILMS; TRANSPARENT ELECTRODES;

ASSEMBLED STRUCTURES; ELECTRONIC JUNCTIONS; NANO-CRYSTALLINE FILMS; NANOCRYSTALLINE ELECTRODES; NANOCRYSTALLINES; OPTOELECTRONIC PROPERTIES; PHOTOVOLTAICS; SENSITIZERS;

MORPHOLOGY;

EID: 0012485050     PISSN: 0277786X     EISSN: 1996756X     Source Type: Conference Proceeding    
DOI: 10.1117/12.312914     Document Type: Conference Paper

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