Extended x-ray absorption fine-structure measurement of bond-length strain in epitaxial Gd2O3 on GaAs(001)

Applied Physics Letters

Volumn 76, Issue 18, 2000, Pages 2526-2528

  Nelson, E J ^a   Woicik, J C ^a   Hong, M ^b   Kwo, J ^b   Mannaerts, J P ^b  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^b LUCENT TECHNOLOGIES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0012479746     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.126397     Document Type: Article

References (10)

1. M. Hong, J. Kwo, A. R. Kortan, J. P. Mannaerts, and A. M. Sergent, Science 283, 1897 (1999).
2. A. R. Kortan, M. Hong, J. Kwo, J. P. Mannaerts, and N. Kopylov, Phys. Rev. B 60, 10913 (1999).
3. The experimental error corresponds to the spread of bond lengths which doubles the residual chi-squared error while the coordination number is allowed to vary.
4. 3)/8 = 2.341 Å. As EXAFS measures the change in bond length of the film relative to the powder, the value Δr=+0.063±0.013 Å is model independent.
5. L. Pauling and M. D. Shappell, Z. Kristallogr. 75, 128 (1930).
6. M. Marezio, Acta Crystallogr. 20, 723 (1966).
7. G. Gashurov and O. J. Sovers, Acta Crystallogr., Sect. B: Struct. Crystallogr. Cryst. Chem. 26, 938 (1970).
8. J. C. Woicik, J. G. Pellegrino, B. Steiner, K. E. Miyano, S. G. Bompadre, L. B. Sorensen, T.-L. Lee, and S. Khalid, Phys. Rev. Lett. 79, 5026 (1997).
9. EXAFS = +2.7%±0.6%.
10. J. C. Woicik, C. E. Bouldin, K. E. Miyano, and C. A. King, Phys. Rev. B 55, 15386 (1997).