Comparison of temperature resolution of single-band, dual-band, and multiband infrared systems

Applied Optics

Volumn 38, Issue 13, 1999, Pages 2820-2823

  Chrzanowski, Krzysztof ^a,b   Bielecki, Zbigniew ^a,b   Szulim, Marek ^a,c  

^a MILITARY UNIVERSITY OF TECHNOLOGY   (Poland)

^b Institute of Optoelectronics   (Poland)

^c The Faculty of Electronics Institute of Electronic Fundamentals   (Poland)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0012419435     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.38.002820     Document Type: Article

References (4)

1. K. Chrzanowski and M. Szulim, “Measure of the influence of detector noise on temperature-measurement accuracy for multiband IR systems,” Appl. Opt. 37, 5051-5057 (1998).
2. G. Holst, “Infrared imaging system testing,” in The Infrared & Electro-Optical Systems Handbook, Vol. 4 of Electro-Optical Systems Design, Analysis and Testing, M. C. Dudzik, ed. (SPIE Press, Bellingham, Wash., 1993), Chap. 4, p. 199.
3. U.S. Department of Defense, U.S. Military Standard MIL-STD-1859, Thermal Imaging Devices, Performance Parameters Of (U.S. Gov. Print. Office, Washington, D.C., 1981).
4. K. Chrzanowski and R. Matyszkiel, “Update on a model of noise equivalent temperature difference NETD of infrared systems for finite distance between sensor-object,” Opt. Appl. 27, 49-54 (1997).