Order-disorder phenomena determined by high-resolution powder diffraction: The structures of tetrakis(trimethylsilyl)methane C[Si(CH3)3]4 and tetrakis(trimethylsilyl)silane Si[Si(CH3)3]4

Acta Crystallographica Section B: Structural Science

Volumn 55, Issue 6, 1999, Pages 1014-1029

  Dinnebier, Robert E ^a   Dollase, Wayne A ^b   Helluy, Xavier ^c   Kümmerlen, Jörg ^d   Sebald, Angelika ^d   Schmidt, Martin U ^e   Pagola, Silvina ^f   Stephens, Peter W ^f   Van Smaalen, Sander ^a  

^a UNIVERSITY OF BAYREUTH   (Germany)

^b UNIVERSITY OF CALIFORNIA   (United States)

^c SANOFI   (France)

^d UNIVERSITÄT BAYREUTH   (Germany)

^e CLARIANT PRODUKTE DEUTSCHLAND GMBH   (Germany)

^f STONY BROOK UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0012372479     PISSN: 01087681     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0108768199006126     Document Type: Article

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