Densities of Si determined by an image digitizing technique in combination with an electrostatic levitator

Applied Physics Letters

Volumn 70, Issue 4, 1997, Pages 423-425

  Ohsaka, K ^a   Chung, S K ^a   Rhim, W K ^a   Holzer, J C ^b  

^a CALIFORNIA INSTITUTE OF TECHNOLOGY   (United States)

^b MEMC Electronic Materials Inc   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0012269053     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.118317     Document Type: Article

References (13)

1. W. K. Rhim, S. K. Chung, D. Barber, K. F. Man, G. Gutt, A. J. Rulison, and R. E. Spjut, Rev. Sci. Instrum. 64, 2961 (1993).
2. W. K. Rhim, S. K. Chung, A. J. Rulison, and R. E. Spjut, Int. J. Thermophys. (accepted for publication).
3. Y. J. Kim, R. Busch, W. L. Johnson, A. J. Rulison, and W. K. Rhim, Appl. Phys. Lett. 68, 1057 (1996).
4. V. M. Glazov, S. N. Chizhevskaya, and N. N. Glagoleva, Liquid Semiconductors (Plenum, New York, 1969).
5. T. Iida and R. I. L. Guthrie, The Physical Properties of Liquid Metals (Oxford University Press, Oxford, 1988).
6. H. Sasaki, E. Tokizaki, K. Terashima, and S. Kimura, Jpn. J. Appl. Phys. 1 33, 3803 (1994); J. Cryst. Growth 139, 225 (1994); Jpn. J. Appl. Phys. 1 33, 6078 (1994).
7. H. Sasaki, E. Tokizaki, K. Terashima, and S. Kimura, Jpn. J. Appl. Phys. 1 33, 3803 (1994); J. Cryst. Growth 139, 225 (1994); Jpn. J. Appl. Phys. 1 33, 6078 (1994).
8. H. Sasaki, E. Tokizaki, K. Terashima, and S. Kimura, Jpn. J. Appl. Phys. 1 33, 3803 (1994); J. Cryst. Growth 139, 225 (1994); Jpn. J. Appl. Phys. 1 33, 6078 (1994).
9. Y. Waseda, K. Shinoda, K. Sugiyama, S. Takeda, K. Terashima, and J. M. Toguri, Jpn. J. Appl. Phys. 1 34, 4124 (1995).
10. S. K. Chung, D. B. Thiessen, and W. K. Rhim, Rev. Sci. Instrum. 67, 3175 (1996).
11. M. Okaji, Int. J. Thermophys. 9, 1101 (1988).
12. S. Krishnan, J. K. R. Weber, P. C. Nordine, R. A. Schiffman, R. H. Hauge, and J. L. Margrave, High Temp. Sci. 30, 137 (1991).
13. E. Takasuka, E. Tokizaki, K. Terashima, and S. Kimura, Appl. Phys. Lett. 67, 152 (1995).