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Volumn 39, Issue 2, 2000, Pages 105-106

Studying biomedical issues of high-frequency radiation

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0012250088     PISSN: 07452993     EISSN: None     Source Type: Trade Journal    
DOI: None     Document Type: Article
Times cited : (1)

References (15)
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    • Shielding the Ill-Effects of EM radiation
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    • Kumar, A.1
  • 4
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    • Were you zapped?
    • January
    • J.F. White, "Were you zapped?" Microwave Journal, January 1981, pp. 16-26.
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    • The conning of America
    • October
    • J.M. Osepchuk, "The Conning Of America," Microwave Journal, October 1978, p. 18.
    • (1978) Microwave Journal , pp. 18
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  • 8
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    • Environmental and occupational exposure to electromagnetic fields
    • March
    • M.A. Stuchly and K.H. Mild, "Environmental And Occupational Exposure to Electromagnetic Fields," IEEE Eng. in Med. and Biol. Magazine, Vol. 6, No. 1, March 1987, pp. 15-17.
    • (1987) IEEE Eng. in Med. and Biol. Magazine , vol.6 , Issue.1 , pp. 15-17
    • Stuchly, M.A.1    Mild, K.H.2
  • 9
    • 24044524797 scopus 로고    scopus 로고
    • AP-S turnstile
    • April
    • R. Bansal, "AP-S Turnstile," IEEE AP-S Magazine, Vol. 39, No. 2, April 1997, p. 96.
    • (1997) IEEE AP-S Magazine , vol.39 , Issue.2 , pp. 96
    • Bansal, R.1
  • 10
    • 0002600312 scopus 로고
    • The cellular phone scare
    • June
    • M. Fischetti, "The Cellular Phone Scare," IEEE Spectrum, June 1993, pp. 43-17.
    • (1993) IEEE Spectrum , pp. 43-117
    • Fischetti, M.1
  • 11
    • 24044549869 scopus 로고    scopus 로고
    • Pop quiz: EMF and your health
    • Aug.-Sept.
    • R. Bansal, "Pop Quiz: EMF and Your Health," IEEE Potentials, Aug.-Sept. 1997, pp. 3-4.
    • (1997) IEEE Potentials , pp. 3-4
    • Bansal, R.1
  • 12
    • 84949077243 scopus 로고
    • Nonionizing electromagnetic wave effects in biological materials and systems
    • June
    • C.C. Johnson and A.W. Guy, "Nonionizing Electromagnetic Wave Effects In Biological Materials And Systems," IEEE Proceedings, Vol. 60, No. 6, June 1972, pp. 692-718.
    • (1972) IEEE Proceedings , vol.60 , Issue.6 , pp. 692-718
    • Johnson, C.C.1    Guy, A.W.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.