Ellipsometric measurement of solid fluorocarbon film thickness on magnetic recording media

Journal of Applied Physics

Volumn 81, Issue 8 PART 2B, 1997, Pages 5378-5380

  Karis, T E ^a   Tyndall, G W ^a   Fenzel Alexander, D ^a   Crowder, M S ^b,c  

^a IBM ALMADEN RESEARCH CENTER   (United States)

^b IBM   (United States)

^c MAXTOR CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0012214901     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.364573     Document Type: Article

References (8)

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