Fringe detection in noisy complex interferograms

Applied Optics

Volumn 35, Issue 20, 1996, Pages 3799-3806

  Trouvé, Emmanuel ^a   Caramma, Marcello ^b   Maître, Henri ^a  

^a TELECOM PARISTECH   (France)

^b POLITECNICO DI MILANO   (Italy)

Author keywords

Interferometry; Phase restoration; Spectral analysis

Indexed keywords

EID: 0012168427     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.35.003799     Document Type: Article

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