Application of MCD in 4f photoemission as an element-specific probe for near-surface magnetization in lanthanide materials

Journal of Electron Spectroscopy and Related Phenomena

Volumn 78, Issue , 1996, Pages 241-245

  Arenholz, E ^a   Starke, K ^a   Navas, E ^a   Kaindl, G ^a  

^a FREIE UNIVERSITÄT BERLIN   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0012153811     PISSN: 03682048     EISSN: None     Source Type: Journal    
DOI: 10.1016/s0368-2048(96)80070-3     Document Type: Article

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