Electron diffraction due to a reflection grating in a conducting wire

Applied Physics Letters

Volumn 71, Issue 24, 1997, Pages 3555-3557

  Park, KyoungWan ^a   Lee, Seongjae ^a   Shin, Mincheol ^a   Yuk, Jong Seol ^a   Lee, El Hang ^a   Kwon, Hyuk Chan ^b  

^a Electronics and Telecommunications Research Institute (ETRI)   (South Korea)

^b Korea Research Institute of Standards and Science   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0012142977     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.120389     Document Type: Article

References (11)

1. G. Timp, A. M. Chang, J. E. Cunningham, T. Y. Chang, P. Mankiewich, R. Behringer, and R. E. Howard, Phys. Rev. Lett. 58, 2814 (1987).
2. C. J. B. Ford, T. J. Thornton, R. Newbury, M. Pepper, H. Ahmed, C. T. Foxon, J. J. Harris, and C. Roberts, J. Phys. C 21, L325 (1988).
3. K. Ismail, W. Chu, D. A. Antoniadis, and Henry I. Smith, Appl. Phys. Lett. 52, 1071 (1988).
4. K. Tsubaki, T. Honda, H. Saito, and Y. Tokura, Appl. Phys. Lett. 58, 376 (1991).
5. J. C. Wu, M. N. Wybourne, W. Yindeepol, A. Weisshaar, and S. M. Goodnick, Appl. Phys. Lett. 59, 102 (1991).
6. D. R. Allee, S. Y. Chou, J. S. Harris, Jr., and R. F. W. Pease, J. Vac. Sci. Technol. B 7, 2015 (1989).
7. K. Park, S. Lee, M. Shin, E-H Lee, and H. C. Kwon, Phys. Rev. B 51, 13805 (1995).
8. S. Bandyopadhyay, G. H. Bernstein, and W. Porod, in Nanostructure Physics and Fabrication, edited by M. A. Reed and W. P. Kirk (Academic, Boston, 1989), p. 183.
9. J.-P Leburton and Yu. B. Lyanda-Geller, Phys. Rev. B 54, 17716 (1996).
10. J. Y. Yoo, J. H. Shin, Y. H. Lee, H.-H. Park, and B.-S. Yoo, Opt. Quantum Electron. 27, 421 (1995).
11. F. P. Milliken, S. Washburn, C. P. Umbach, R. B. Laibowitz, and R. A. Webb, Phys. Rev. B 36, 4465 (1987).