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Volumn 56, Issue 1, 2000, Pages 50-52

Compositional disorder in frans-[RhBr0.26Cl0.74H(PMe3) 4]-[B(1,2-O2C6Br4)]·CH 2Cl2

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0012123435     PISSN: 01082701     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0108270199013554     Document Type: Article
Times cited : (10)

References (13)
  • 12
    • 0004150157 scopus 로고
    • Siemens Analytical X-ray Instruments Inc., Madison, Wisconsin, USA
    • Siemens (1995b). SHELXTL. Version 5.03. Siemens Analytical X-ray Instruments Inc., Madison, Wisconsin, USA.
    • (1995) SHELXTL. Version 5.03


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.