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Volumn 57, Issue 3, 2001, Pages 428-434

Topochemically controlled solid-state methyl rearrangement in thiocyanurates

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0012106945     PISSN: 01087681     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0108768101005171     Document Type: Article
Times cited : (16)

References (27)
  • 9
    • 0040142863 scopus 로고    scopus 로고
    • To be published
    • Kaftory, M. (2001). To be published.
    • (2001)
    • Kaftory, M.1
  • 15
    • 0039551477 scopus 로고
    • Natuurkundig Laboratorium, NV Philips Gloeiampenfabrieken, Eindhoven, The Netherlands
    • Philips (1973). Software for Philips PW 1100/20. Natuurkundig Laboratorium, NV Philips Gloeiampenfabrieken, Eindhoven, The Netherlands.
    • (1973) Software for Philips PW 1100/20
  • 17
    • 0004150157 scopus 로고    scopus 로고
    • University of Góttingen, Germany
    • Sheldrick, G. M. (1997a). SHELXS97. University of Góttingen, Germany.
    • (1997) SHELXS97
    • Sheldrick, G.M.1
  • 18
    • 0004150157 scopus 로고    scopus 로고
    • University of Góttingen, Germany
    • Sheldrick, G. M. (1997b). SHELXL97. University of Góttingen, Germany.
    • (1997) SHELXL97
    • Sheldrick, G.M.1
  • 19
    • 0039551474 scopus 로고
    • Siemens Analytical X-ray Instruments Inc., Madison, Wisconsin, USA
    • Siemens (1994). XSCANS. Siemens Analytical X-ray Instruments Inc., Madison, Wisconsin, USA.
    • (1994) XSCANS
  • 20
    • 0003561320 scopus 로고
    • Siemens Analytical X-ray Instruments Inc., Madison, Wisconsin, USA
    • Siemens (1995). SMART and SAINT. Siemens Analytical X-ray Instruments Inc., Madison, Wisconsin, USA.
    • (1995) SMART and SAINT


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.