Cross-sectional specimen preparation and observation of a plasma sprayed coating using a focused ion beam/transmission electron microscopy system

Microscopy and Microanalysis

Volumn 6, Issue 3, 2000, Pages 218-223

  Yaguchi, Toshie ^a,b   Kamino, Takeo ^b   Sasaki, Mitsumasa ^c   Barbezat, Gerard ^d   Urao, Ryoichi ^a  

^a IBARAKI UNIVERSITY   (Japan)

^b HITACHI LTD   (Japan)

^c Sulzer Metco Japan Ltd   (Japan)

^d Sulzer Ltd   (Switzerland)

Author keywords

Electron diffraction pattern; Energy dispersive x ray; Focused ion beam; High resolution electron microscopic image; Plasma sprayed coating; Transmission electron microscopy

Indexed keywords

EID: 0012099077     PISSN: 14319276     EISSN: None     Source Type: Journal    
DOI: 10.1017/s1431927600000362     Document Type: Article

References (2)

1. Ishitani T, Tsuboi H, Yaguchi T, Koike H (1994) Transmission electron microscope sample preparation using a focused ion beam. J Electron Microsc 43:322-326
2. Neureuther AR, Liu CY, Ting CH (1979) Model ion milling. J Vac Sci Technol 16:1767-1771