Temperature dependence of silicon carrier effective masses with application to femtosecond reflectivity measurements

Journal of the Optical Society of America B: Optical Physics

Volumn 19, Issue 5, 2002, Pages 1092-1100

  Riffe, D M ^a  

^a UTAH STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CARRIER CONCENTRATION; ELECTRONS; HOT CARRIERS; LIGHT REFLECTION; SILICON;

FEMTOSECOND REFLECTIVITY;

SEMICONDUCTOR LASERS;

EID: 0012068962     PISSN: 07403224     EISSN: None     Source Type: Journal    
DOI: 10.1364/JOSAB.19.001092     Document Type: Article

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