Instability of field emission from silicon covered with a thin oxide due to electron trapping

Journal of Applied Physics

Volumn 79, Issue 7, 1996, Pages 3703-3707

  Huang, Qing An ^a  

^a SOUTHEAST UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0012067594     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.361202     Document Type: Article

References (15)

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