Recording performance of submicron track width thin film heads

Journal of Applied Physics

Volumn 79, Issue 8 PART 2B, 1996, Pages 5645-5647

  Lam, T T ^a   Luo, Y ^a   Zhu, J G ^a   Tong, H C ^b   Rottmayer, R ^b  

^a UNIVERSITY OF MINNESOTA   (United States)

^b WESTERN DIGITAL CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0011986583     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.361850     Document Type: Article

References (5)

1. C. Tsang, H. Santini, D. McCown, J. Lo, and R. Lee, TMRC'95 (to be published).
2. C. Tsang, J. Appl. Phys. 69, 5393 (1991).
3. X. Che, IEEE Trans. Magn. 31, 3021 (1995).
4. J.-G. Zhu, T. T. Lam, Y. Luo, and X. Ye, these proceedings.
5. J.-G. Zhu, X.-G. Ye, and T. C. Arnoldussen, IEEE Trans. Magn. 29, 324 (1993).