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Volumn 220, Issue 1-2, 1996, Pages 117-122

On the applied stress dependence of the subgrain size

Author keywords

Optical metallography; Subgrain size; Transmission electron microscopy

Indexed keywords

DATA REDUCTION; DIFFERENTIAL EQUATIONS; GRAIN SIZE AND SHAPE; PARTICLE SIZE ANALYSIS; STRESS ANALYSIS; TRANSMISSION ELECTRON MICROSCOPY;

EID: 0011980091     PISSN: 09215093     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-5093(96)10432-9     Document Type: Article
Times cited : (8)

References (9)
  • 8
    • 0022217860 scopus 로고
    • Cambridge University Press, Cambridge
    • J.P. Poirier, Creep of Crystals, Cambridge University Press, Cambridge, 1985.
    • (1985) Creep of Crystals
    • Poirier, J.P.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.