The response of MOS devices to dose-enhanced low-energy radiation

IEEE Transactions on Nuclear Science

Volumn 33, Issue 6, 1986, Pages 1245-1251

  Fleetwood, D M ^a   Winokur, P S ^a   Lorence, L J ^a   Beezhold, W ^a   Dressendorfer, P V ^a   Schwank, J R ^a  

^a SANDIA NATIONAL LABORATORIES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0011978980     PISSN: 00189499     EISSN: 15581578     Source Type: Journal    
DOI: 10.1109/TNS.1986.4334586     Document Type: Article

References (22)

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11. For a study of dose enhancement of medium energy radiation, see W. Beezhold, D. M. Fleetwood, L. J. Lorence, Jr., D. Knott, P. S. Winokur, and N. Counts, 1986 HEART conference.
12. The thickness of the bilaminate layers was chosen because of ease in handling, and to make contact with previous experimental work. For a discussion of the use of a similar bilaminate in studies of medium energy radiation effects, see: L. D. Posey, T. F. Wrobel, D. C. Evans, W. Beezhold, J. G. Kelly, C. J. McCallum, F. N. Coppage, T. F. Luera, L. J. Lorence, Jr., and A. J. Smith, IEEE Trans. Nuc. Sci. NS-32, 4446 (1985).
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14. There was about an 0.8 mm air gap between the bilaminate and the capacitor under test, which could lead to some additional beam attenuation.
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