Beam diagnostics extracted from radio frequency driven ion source

Review of Scientific Instruments

Volumn 71, Issue 2, 2000, Pages 1137-1139

  Abdelaziz, M E ^a   Zakhary, S G ^a   Ragheb, M S ^a  

^a HOT LABORATORIES CENTER   (Egypt)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0011916892     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1150408     Document Type: Article

References (5)

1. S. G. Zakhary, The Third International Conference or Engineering Math and Physics, Cairo University, 23-26 December, 1997 (unpublished).
2. Y. Rao, D. Tang, X. Liu, and B. Shen, Rev. Sci. Instrum. 61, 321 (1990).
3. S. G. Zakhary, Rev. Sci. Instrum. 66, 5419 (1995).
4. T. S. Green, IEEE Trans. Nucl. Sci. 23, 918 (1976).
5. L. Vali, Atom and Ion Sources (Wiley-Interscience, New York, 1977).