Modeling of thin dielectric layers in finite difference schemes

Optics InfoBase Conference Papers

Volumn , Issue , 1999, Pages 253-255

  Helfert, Stefan F ^a   Pregla, Reinhold ^a  

^a UNIVERSITY OF HAGEN   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0011855842     PISSN: None     EISSN: 21622701     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (10)

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